James A. O'Donnell is an author at Intel (United States) specializing in electronic packaging, engineering, and computer engineering.
Top concepts
EngineeringMicroelectronicsComputer EngineeringElectronic PackagingElectrical EngineeringMemory DevicesMemory ReliabilityComputer ArchitectureResistive Random-access Memory3D Memory
Publications per year
2009–2020
3
3
Non-Volatile RRAM Embedded into 22FFL FinFET Technology
O. Golonzka, Ümüt Arslan, Peng Bai et al. · 2019 · 71 citations
eNVM RRAM reliability performance and modeling in 22FFL FinFET technology
Yao‐Feng Chang, James A. O'Donnell, Tony Acosta et al. · 2020 · 19 citations
Sangwoo Pae, T. Ghani, M. Hattendorf et al. · IEEE International Reliability Physics Symposium proceedings · 2009 · 13 citations
Reliability, End-of-life Reliability Assessment, Electrical Engineering +15
Rows per page
1–3 of 3