Tony Acosta is an author at Intel (United States) specializing in electrical engineering, microelectronics, and engineering.
Top concepts
EngineeringMicroelectronicsElectrical EngineeringApplied PhysicsElectronic PackagingMechanics Of MaterialsMemory DevicesSemiconductorsNanoelectronicsMicrofabrication
Publications per year
2006–2020
4
4
Strain additivity in III-V channels for CMOSFETs beyond 22nm technology node
S. Suthram, Yubing Sun, P. Majhi et al. · 2008 · 25 citations
eNVM RRAM reliability performance and modeling in 22FFL FinFET technology
Yao‐Feng Chang, James A. O'Donnell, Tony Acosta et al. · 2020 · 19 citations
A Reliability Overview of Intel’s 10+ Logic Technology
R. Grover, Tony Acosta, C. AnDyke et al. · 2020 · 13 citations
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