J.R. Coss

Heavy ion and proton induced single event transients in comparators

D. K. Nichols, J.R. Coss, T. F. Miyahira et al. · IEEE Transactions on Nuclear Science · 1996 · 55 citations

Electrical Engineering, Heavy Ion Physic, Engineering +12

Observations of single event failure in power MOSFETs

D. K. Nichols, K.P. McCarty, J.R. Coss et al. · 2005 · 46 citations

Reliability, Electrical Engineering, Reliability Engineering +13

Single event gate rupture in commercial power MOSFETs

D. K. Nichols, J.R. Coss, K.P. McCarty · 2002 · 35 citations

Engineering, Nuclear Physics, Radiation Physics +16

An observation of proton-induced latchup (in CMOS microprocessor)

D. K. Nichols, J.R. Coss, Robert Watson et al. · IEEE Transactions on Nuclear Science · 1992 · 31 citations

Heavy Ion Physic, Engineering, Nuclear Physics +9

Temperature and Epi Thickness Dependence of the Heavy Ion Induced Latchup Threshold for a CMOS/EPI 16K Static RAM

L. S. Smith, D. K. Nichols, J.R. Coss et al. · IEEE Transactions on Nuclear Science · 1987 · 25 citations

Non-volatile Memory, Electrical Engineering, Xenon Ions +13