Concepedia

Author

J.R. Coss

Jet Propulsion Laboratory

Also Known As

J. R. Coss, J.R. Coss, James R. Coss

34

Publications

374

Citations

12

H-Index

49

Concepts

All Affiliations

Jet Propulsion LaboratoryCalifornia Institute of TechnologyBoeing (United States)The Aerospace CorporationNaval Surface Warfare Center
JC

About

J.R. Coss is an author at Jet Propulsion Laboratory specializing in engineering, electrical engineering, and single event effects.

Top Concepts

#ConceptH-IndexPublicationsCitations

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Engineering

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Natural Sciences

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Applied Physics

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Medicine

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Education

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J.R. Coss

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15

Publications

350

Citations

12

H-Index

YearCitations

Heavy ion and proton induced single event transients in comparators

D. K. Nichols, J.R. Coss, T. F. Miyahira,

IEEE Transactions on Nuclear Science

1996

55

Observations of single event failure in power MOSFETs

D. K. Nichols, K.P. McCarty, J.R. Coss,

2005

46

Single event gate rupture in commercial power MOSFETs

D. K. Nichols, J.R. Coss, K.P. McCarty

2002

35

An observation of proton-induced latchup (in CMOS microprocessor)

D. K. Nichols, J.R. Coss, Robert Watson,

IEEE Transactions on Nuclear Science

1992

31

Temperature and Epi Thickness Dependence of the Heavy Ion Induced Latchup Threshold for a CMOS/EPI 16K Static RAM

L. S. Smith, D. K. Nichols, J.R. Coss,

IEEE Transactions on Nuclear Science

1987

25

Compendium of single event failures in power MOSFETs

J.R. Coss, G.M. Swift, Luis E. Selva,

2002

22

Update of single event failure in power MOSFETs

D. K. Nichols, J.R. Coss, T. F. Miyahira,

2002

22

Device SEE susceptibility from heavy ions (1995-1996)

D. K. Nichols, J.R. Coss, T. F. Miyahira,

2002

19

Device susceptibility update: 1999-2000

J.R. Coss

2002

19

Overview Of Device See Susceptibility From Heavy Ions

D. K. Nichols, J.R. Coss, K.P. McCarty,

2005

15

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