L. S. Smith

Characterization of multiple-bit errors from single-ion tracks in integrated circuits

J. A. Zoutendyk, Larry D. Edmonds, L. S. Smith · IEEE Transactions on Nuclear Science · 1989 · 68 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +16

Whooping crane recovery plan

David L. Olsen, David Blankenship, Harold D. Irby et al. · 1980 · 55 citations

Emergency Management, It Disaster Recovery, Crane Recovery Plan +1

Experimental Evidence for a New Single-Event Upset (SEU) Mode in a CMOS SRAM Obtained from Model Verification

J. A. Zoutendyk, L. S. Smith, George Soli et al. · IEEE Transactions on Nuclear Science · 1987 · 31 citations

Engineering, Vlsi Design, Computer Architecture +18

Recent Trends in Parts SEU Susceptibility from Heavy Ions

D. K. Nichols, L. S. Smith, William E. Price et al. · IEEE Transactions on Nuclear Science · 1987 · 29 citations

Electrical Engineering, Heavy Ion Physic, Engineering +11

Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM

J. A. Zoutendyk, L. S. Smith, George Soli et al. · IEEE Transactions on Nuclear Science · 1985 · 27 citations

Hardware Security, Electrical Engineering, Single-event Upset +12