Publication | Closed Access
Observations of single event failure in power MOSFETs
46
Citations
10
References
2005
Year
Unknown Venue
ReliabilityElectrical EngineeringReliability EngineeringGate RuptureEngineeringHardware ReliabilitySoftware TestingSingle Event EffectsFailure AnalysisCircuit ReliabilityPower MosfetsMicroelectronicsFailure ThresholdsStatisticsSingle Event FailureDevice Reliability
This first compendium of single event test data for power MOSFETs provides failure thresholds from burnout or gate rupture for over 100 devices of eight manufacturers. Ordering the data has also provided some useful insights.
| Year | Citations | |
|---|---|---|
Page 1
Page 1