K.P. McCarty

Observations of single event failure in power MOSFETs

D. K. Nichols, K.P. McCarty, J.R. Coss et al. · 2005 · 46 citations

Reliability, Electrical Engineering, Reliability Engineering +13

Single event gate rupture in commercial power MOSFETs

D. K. Nichols, J.R. Coss, K.P. McCarty · 2002 · 35 citations

Engineering, Nuclear Physics, Radiation Physics +16

Multi-megarad (Si) radiation-tolerant integrated CMOS imager

B. Hancock, Thomas J. Cunningham, K.P. McCarty et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 28 citations

Engineering, Radiation Exposure, Minimal Change +20

Overview Of Device See Susceptibility From Heavy Ions

D. K. Nichols, J.R. Coss, K.P. McCarty et al. · 2005 · 15 citations · Full text

Electrical Engineering, Heavy Ion Physic, Engineering +13

Single event effects testing of the Crystal CS5327 16-bit ADC

K.P. McCarty, J.R. Coss, D. K. Nichols et al. · 2005 · 12 citations

Engineering, Heavy Ion Bombardment, Computer Architecture +16