A. E. Waskiewicz

Burnout of Power MOS Transistors with Heavy Ions of Californium-252

A. E. Waskiewicz, John W. Groninger, V. H. Strahan et al. · IEEE Transactions on Nuclear Science · 1986 · 163 citations

Engineering, Electrical Engineering, Microelectronics +16

Observations of single event failure in power MOSFETs

D. K. Nichols, K.P. McCarty, J.R. Coss et al. · 2005 · 46 citations

Engineering, Electrical Engineering, Microelectronics +16

Trends in Parts Susceptibility to Single Event Upset from Heavy Ions

Donald K. Nichols, William E. Price, W. A. Kolasinski et al. · IEEE Transactions on Nuclear Science · 1985 · 35 citations

Engineering, Aerospace Engineering, Physics +17

Heavy Ion Induced Permanent Damage in MNOS Gate Insulators

J.C. Pickel, J. T. Blandford, A. E. Waskiewicz et al. · IEEE Transactions on Nuclear Science · 1985 · 23 citations

Engineering, Electrical Engineering, Nuclear Engineering +15

Cosmic Ray Induced Permanent Damage in MNOS EAROMs

J. T. Blandford, A. E. Waskiewicz, J.C. Pickel · IEEE Transactions on Nuclear Science · 1984 · 18 citations

Engineering, Electrical Engineering, Materials Science +17