Publication | Closed Access
Heavy ion and proton induced single event transients in comparators
55
Citations
2
References
1996
Year
Electrical EngineeringHeavy Ion PhysicEngineeringPhysicsLow Let ThresholdNatural SciencesPulse DurationParticle PhysicsIon Beam InstrumentationIon BeamPulse PowerInstrumentationAccelerator PhysicHeavy IonTransient Vital Signs
This paper presents a display of heavy-ion- and proton-induced single event transients for three comparators. The transient vital signs are serious: low LET threshold, very high voltage amplitude and extended pulse duration (microsecs.).
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