IEEE Transactions on Nuclear Science · 1996 · 55 citations · 2 references
EngineeringElectrical EngineeringPhysicsMicroelectronicsHeavy-ion PhysicsPulse ProcessingComparator DesignComparatorsHeavy Ion RadiationHeavy-ion ReactionsPulse Duration EffectsSingle Event Effects
This paper presents a display of heavy-ion- and proton-induced single event transients for three comparators. The transient vital signs are serious: low LET threshold, very high voltage amplitude and extended pulse duration (microsecs.).
2
Observation of single event upsets in analog microcircuits
R. Koga, S.D. Pinkerton, Steven C. Moss et al. · IEEE Transactions on Nuclear Science · 1993 · 130 citations
Observation of heavy ion induced transients in linear circuits
R. Ecoffet, S. Duzellier, P. Tastet et al. · 2005 · 84 citations