Statistics
Publications
4
Citations
93
H-Index
4
Active since
2008
C. Binois is an author at Centre National d'Études Spatiales specializing in device characterization, engineering, and semiconductor devices.
Publications per year
2008–2012
4
4
Influence of beam conditions and energy for SEE testing
V. Ferlet-Cavrois, J.R. Schwank, Siqing LIU et al. · 2011 · 26 citations
Engineering, Electrical Engineering, Nuclear Engineering +17
SEGR Study on Power MOSFETs: Multiple Impacts Assumption
D. Peyre, Ch. Poivey, C. Binois et al. · IEEE Transactions on Nuclear Science · 2008 · 22 citations
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