Yunfei Deng - Concepedia

Author

Yunfei Deng

GlobalFoundries (United States)

Also Known As

<p>Yunfei Deng</p>, Yunfei Deng

Publications

754

Citations

H-Index

Concepts

All Affiliations

GlobalFoundries (United States)Advanced Micro Devices (United States)Guangdong University of Technology University of California, Berkeley IBM (United States)

About

Yunfei Deng is an author at GlobalFoundries (United States) specializing in engineering, computer engineering, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	17	411
2	Natural Sciences	4	4	82
3	Medicine	2	2	25
4	Social Sciences	2	2	27
5	Health Sciences	1	1	23

Yunfei Deng

Publications

602

Citations

H-Index

Page 1

	Year	Citations
A novel and facile-to-synthesize three-dimensional honeycomb-like nano-Fe3O4@C composite: Electromagnetic wave absorption with wide bandwidth Yunfei Deng, Yun Zheng, Danfeng Zhang, Carbon Materials ScienceElectromagnetic Wave AbsorptionFunctional NanomaterialsEngineeringNanomaterials	2020	95
Integration of EUV lithography in the fabrication of 22-nm node devices Obert R. Wood, Chiew-Seng Koay, Karen Petrillo, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2009	49
The use of EUV lithography to produce demonstration devices Bruno LaFontaine, Yunfei Deng, Ryoung-Han Kim, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2008	42
Decomposition strategies for self-aligned double patterning Yuansheng Ma, Jason Sweis, Chris Bencher, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Mathematical ProgrammingEngineeringVlsi DesignElectronic Design AutomationComputer Architecture	2010	41
Ultrafine FeNi3 Nanocrystals Embedded in 3D Honeycomb-Like Carbon Matrix for High-Performance Microwave Absorption Congai Han, Haiyan Zhang, Danfeng Zhang, Nanomaterials	2020	32
Resist pattern prediction at EUV John J. Biafore, Mark D. Smith, Eelco van Setten, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringComputational ChemistryResist Pattern PredictionAcid GenerationElectron Physic	2010	30
Extreme ultraviolet mask defect simulation: Low-profile defects Tom Pistor, Yunfei Deng, Andrew R. Neureuther Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Ultraviolet LightDefect HeightEngineeringLow-profile DefectsNondestructive Testing	2000	27
Reduced graphene oxide wrapped 3D-ultrathin CoS2 nanoflakes as an absorbing material with enhanced microwave absorption Danfeng Zhang, Chengjie Yan, Yun Zheng, Progress in Natural Science Materials International	2022	26
Layout small-angle rotation and shift for EUV defect mitigation Hongbo Zhang, Yuelin Du, Martin D. F. Wong, EngineeringElectron-beam LithographyComputer-aided DesignDefect ToleranceReliability Engineering	2012	24
Architectural choices for EUV lithography masks: patterned absorbers and patterned reflectors Bruno La Fontaine, Adam R. Pawloski, Yunfei Deng, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringElectron-beam LithographyComputational IlluminationIllumination ModelingBeam Lithography	2004	24

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