Hong Ng

Statistics

Publications

Citations

419

H-Index

Active since

1987

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

IBM (United States)

Hong Ng is an author at IBM Research - Thomas J. Watson Research Center specializing in semiconductor devices, engineering, and electrical engineering.

Publications per year

1987–2006

Publications

Dual stress liner for high performance sub-45nm gate length SOI CMOS manufacturing

Haining Yang, R. Malik, Y. Li et al. · 2005 · 142 citations

Engineering, Electrical Engineering, Manufacturing Engineering +11

Design and experimental technology for 0.1-µm gate-length low-temperature operation FET's

G.A. Sai-Halasz, M.R. Wordeman, D. P. Kern et al. · IEEE Electron Device Letters · 1987 · 136 citations

Engineering, Electrical Engineering, Materials Science +11

Plasma-etching processes for ULSI semiconductor circuits

M. Armacost, P.D. Hoh, Rich Wise et al. · IBM Journal of Research and Development · 1999 · 57 citations

Engineering, Electrical Engineering, Materials Science +17

A high performance 0.25 mu m CMOS technology

B. Davari, Wei‐Hsu Chang, M.R. Wordeman et al. · 2003 · 26 citations

Engineering, Computer Engineering, Electrical Engineering +16

Experimental technology and characterization of self-aligned 0.1&amp;#181;m-gate-length low-temperature operation NMOS devices

G.A. Sai-Halasz, M.R. Wordeman, D. P. Kern et al. · 1987 · 24 citations

Engineering, Electrical Engineering, Microelectronics +12

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