L. Clément

Improved precision in strain measurement using nanobeam electron diffraction

Armand Béché, Jean‐Luc Rouvière, L. Clément et al. · Applied Physics Letters · 2009 · 160 citations

Engineering, Microscopy, Electron Diffraction +19

Strain measurements by convergent-beam electron diffraction: The importance of stress relaxation in lamella preparations

L. Clément, R. Pantel, L.F.Tz. Kwakman et al. · Applied Physics Letters · 2004 · 152 citations

Lamella Preparations, Engineering, Microscopy +18

Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers

Florent Houdellier, C. Roucau, L. Clément et al. · Ultramicroscopy · 2006 · 81 citations

Engineering, Physics, Strain Localization +9

FDSOI devices with thin BOX and ground plane integration for 32nm node and below

C. Fenouillet-Béranger, S. Denorme, P. Perreau et al. · 2008 · 39 citations

Engineering, Vlsi Design, Thin Box +20

Retrieving overlapping crystals information from TEM nano‐beam electron diffraction patterns

Alexia Valéry, E.F. Rauch, L. Clément et al. · Journal of Microscopy · 2017 · 30 citations