Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers

Introduction to Conventional Transmission Electron Microscopy

Marc De Graef · Materials Today · 2003 · 230 citations · Full text

Materials Science, Electron Scattering, Engineering +11

Strained state of Ge(Si) islands on Si: Finite element calculations and comparison to convergent beam electron-diffraction measurements

Silke Christiansen, M. Albrecht, H. P. Strunk et al. · Applied Physics Letters · 1994 · 183 citations

Engineering, Silicon On Insulator, Displacement Field +20

Strain measurements by convergent-beam electron diffraction: The importance of stress relaxation in lamella preparations

L. Clément, R. Pantel, L.F.Tz. Kwakman et al. · Applied Physics Letters · 2004 · 152 citations

Lamella Preparations, Engineering, Microscopy +18

Automated lattice parameter measurement from HOLZ lines and their use for the measurement of oxygen content in YBa2Cu3O7-δ from nanometer-sized region

Jian‐Min Zuo · Ultramicroscopy · 1992 · 136 citations

Materials Science, Engineering, Applied Physics +5

Introduction to Conventional Transmission Electron Microscopy

L.E. Murr · Materials Characterization · 2003 · 80 citations

Engineering, Electron Microscopy, Physics +5