Florent Houdellier

Nanoscale holographic interferometry for strain measurements in electronic devices

Martin Hÿtch, Florent Houdellier, F. Hüe et al. · Nature · 2008 · 460 citations

Natural Sciences, Materials Engineering, Materials Science +16

Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy

F. Hüe, Martin Hÿtch, H. Bender et al. · Physical Review Letters · 2008 · 186 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Development of a high brightness ultrafast Transmission Electron Microscope based on a laser-driven cold field emission source

Florent Houdellier, Giuseppe Caruso, Sébastien Weber et al. · HAL (Le Centre pour la Communication Scientifique Directe) · 2018 · 137 citations

Engineering, Materials Science, Physics +8

Experimental application of sum rules for electron energy loss magnetic chiral dichroism

L. Calmels, Florent Houdellier, B. Warot-Fonrose et al. · Physical Review B · 2007 · 88 citations · Full text

Natural Sciences, Chemistry, Physics +17

Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers

Florent Houdellier, C. Roucau, L. Clément et al. · Ultramicroscopy · 2006 · 81 citations

Natural Sciences, Materials Engineering, Materials Science +14