Nanoscale holographic interferometry for strain measurements in electronic devices

Electron Microscopy of Thin Crystals

Nature · 1963 · 4K citations

Natural Sciences, Materials Science, Physics +10

Quantitative measurement of displacement and strain fields from HREM micrographs

Martin Hÿtch, E. Snoeck, R. Kilaas · Ultramicroscopy · 1998 · 2.7K citations

Engineering, Biophysics, Materials Engineering +14

The finite element method for engineers

Choice Reviews Online · 1995 · 1.7K citations

Engineering, Computational Engineering, Mechanical Engineering +17

Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors

Minjoo Larry Lee, Eugene A. Fitzgerald, Mayank T. Bulsara et al. · Journal of Applied Physics · 2004 · 957 citations

Engineering, Electrical Engineering, Materials Science +17

Strained silicon as a new electro-optic material

Rune Shim Jacobsen, K.N. Andersen, P.I. Borel et al. · Nature · 2006 · 657 citations

Engineering, Materials Engineering, Materials Science +14