J.-F. Damlencourt

Impact of SOI, Si<inf>1-x</inf>Ge<inf>x</inf>OI and GeOI substrates on CMOS compatible Tunnel FET performance

F. Mayer, C. Le Royer, J.-F. Damlencourt et al. · 2008 · 237 citations

Semiconductor Technology, Electrical Engineering, Engineering +12

HfO 2 / SiO 2 interface chemistry studied by synchrotron radiation x-ray photoelectron spectroscopy

O. Renault, D. Samour, J.-F. Damlencourt et al. · Applied Physics Letters · 2002 · 200 citations

Materials Science, Ii-vi Semiconductor, Sio2 Contributions +14

Interface and material characterization of thin Al2O3 layers deposited by ALD using TMA/H2O

L.G. Gosset, J.-F. Damlencourt, O. Renault et al. · Journal of Non-Crystalline Solids · 2002 · 125 citations

Materials Science, Aluminium Nitride, Material Analysis +7

Enhanced photoluminescence of heavily n-doped germanium

M. El Kurdi, T. Kociniewski, T.-P. Ngo et al. · Applied Physics Letters · 2009 · 123 citations

Ii-vi Semiconductor, Room Temperature, Electrical Engineering +14

Growth of Si nanocrystals on alumina and integration in memory devices

T. Baron, A.J.S. Fernandes, J.-F. Damlencourt et al. · Applied Physics Letters · 2003 · 57 citations · Full text

Engineering, Si Nanocrystals, Silicon On Insulator +17