Campbell Millar

Accurate Statistical Description of Random Dopant-Induced Threshold Voltage Variability

Campbell Millar, D. Reid, Gareth Roy et al. · IEEE Electron Device Letters · 2008 · 70 citations

Engineering, Computer Engineering, Electrical Engineering +17

Variability Aware Simulation Based Design- Technology Cooptimization (DTCO) Flow in 14 nm FinFET/SRAM Cooptimization

Asen Asenov, B. Cheng, Xingsheng Wang et al. · IEEE Transactions on Electron Devices · 2014 · 66 citations

Engineering, Computer Engineering, Design +17

Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP

B. Cheng, Daryoosh Dideban, Negin Moezi et al. · IEEE Design & Test of Computers · 2010 · 66 citations

Engineering, Computer Engineering, Design Automation +14

Analysis of Threshold Voltage Distribution Due to Random Dopants: A 100 000-Sample 3-D Simulation Study

Dave Reid, Campbell Millar, Gareth Roy et al. · IEEE Transactions on Electron Devices · 2009 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

Interplay Between Process-Induced and Statistical Variability in 14-nm CMOS Technology Double-Gate SOI FinFETs

Xingsheng Wang, B. Cheng, A. R. Brown et al. · IEEE Transactions on Electron Devices · 2013 · 56 citations

Engineering, Computer Engineering, Electrical Engineering +17