Dave Reid

Analysis of Threshold Voltage Distribution Due to Random Dopants: A 100 000-Sample 3-D Simulation Study

Dave Reid, Campbell Millar, Gareth Roy et al. · IEEE Transactions on Electron Devices · 2009 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

Understanding LER-Induced MOSFET $V_{T}$ Variability—Part I: Three-Dimensional Simulation of Large Statistical Samples

Dave Reid, Campbell Millar, Scott Roy et al. · IEEE Transactions on Electron Devices · 2010 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +17

Accurate Simulation of Transistor-Level Variability for the Purposes of TCAD-Based Device-Technology Cooptimization

Louis Gerrer, A. R. Brown, Campbell Millar et al. · IEEE Transactions on Electron Devices · 2015 · 26 citations

Engineering, Computer Engineering, Electrical Engineering +17

Understanding LER-induced statistical variability: A 35,000 sample 3D simulation study

Dave Reid, Campbell Millar, Gareth Roy et al. · 2009 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +17

Understanding LER-Induced MOSFET $V_{T}$ Variability—Part II: Reconstructing the Distribution

Dave Reid, Campbell Millar, Scott Roy et al. · IEEE Transactions on Electron Devices · 2010 · 16 citations

Engineering, Electrical Engineering, Circuit Theory +15