Louis Gerrer

Investigation of the RTN Distribution of Nanoscale MOS Devices From Subthreshold to On-State

Salvatore Amoroso, Christian Monzio Compagnoni, A. Ghetti et al. · IEEE Electron Device Letters · 2013 · 38 citations · Full text

Electrical Engineering, Rtn Distribution, Engineering +13

Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging

Meng Duan, J. F. Zhang, Zhigang Ji et al. · IEEE Transactions on Electron Devices · 2016 · 34 citations · Full text

Accuracy and Issues of the Spectroscopic Analysis of RTN Traps in Nanoscale MOSFETs

Fikru Adamu-Lema, Christian Monzio Compagnoni, Salvatore Amoroso et al. · IEEE Transactions on Electron Devices · 2013 · 30 citations

Electrical Engineering, Rtn Traps, Engineering +14

3-D Statistical Simulation Comparison of Oxide Reliability of Planar MOSFETs and FinFET

Louis Gerrer, Salvatore Amoroso, Stanislav Markov et al. · IEEE Transactions on Electron Devices · 2013 · 24 citations

Engineering, Vlsi Design, Oxide Reliability +18

Accurate Simulation of Transistor-Level Variability for the Purposes of TCAD-Based Device-Technology Cooptimization

Louis Gerrer, A. R. Brown, Campbell Millar et al. · IEEE Transactions on Electron Devices · 2015 · 24 citations

Tcad-based Device-technology Cooptimization, Engineering, Vlsi Design +18