Scott Roy

Simulation Study of Individual and Combined Sources of Intrinsic Parameter Fluctuations in Conventional Nano-MOSFETs

Gareth Roy, A. R. Brown, Fikru Adamu-Lema et al. · IEEE Transactions on Electron Devices · 2006 · 278 citations

Device Modeling, Wide-bandgap Semiconductor, Electrical Engineering +15

Contextual LSTM (CLSTM) models for Large scale NLP tasks

Shalini Ghosh, Oriol Vinyals, Brian Strope et al. · arXiv (Cornell University) · 2016 · 190 citations · Full text

Natural Language Processing, Retrieval Augmented Generation, Sequence Modelling +13

Si/SiGe heterostructure parameters for device simulations

Lianfeng Yang, J.R. Watling, R.C.W. Wilkins et al. · Semiconductor Science and Technology · 2004 · 155 citations

Device Modeling, Materials Engineering, Electrical Engineering +13

Online Models for Content Optimization

Deepak Agarwal, Bee-Chung Chen, Pradheep Elango et al. · 2008 · 106 citations

Accurate Statistical Description of Random Dopant-Induced Threshold Voltage Variability

Campbell Millar, D. Reid, Gareth Roy et al. · IEEE Electron Device Letters · 2008 · 70 citations

Device Modeling, Hardware Security, Electrical Engineering +14