Wei-Kai Shih

Modeling gate leakage current in nMOS structures due to tunneling through an ultra-thin oxide

Wei-Kai Shih, Everett X. Wang, S. Jallepalli et al. · Solid-State Electronics · 1998 · 83 citations

Device Modeling, Electrical Engineering, Engineering +10

From Layout to System: Early Stage Power Delivery and Architecture Co-Exploration

Cheng Zhuo, Kassan Unda, Yiyu Shi et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2018 · 58 citations

Hardware Modeling, Pd Simulators, Engineering +21

A three-transistor threshold voltage model for halo processes

R. Rios, Wei-Kai Shih, A. Shah et al. · 2003 · 43 citations

Device Modeling, Electrical Engineering, Engineering +12

An efficient surface potential solution algorithm for compact MOSFET models

R. Rios, S. Mudanai, Wei-Kai Shih et al. · 2005 · 33 citations

Numerical Analysis, Engineering, Numerical Simulation +17

A general partition scheme for gate leakage current suitable for MOSFET compact models

Wei-Kai Shih, R. Rios, P. Packan et al. · 2002 · 30 citations

Device Modeling, Electrical Engineering, Semiconductor Device +13