Anthony M. Phan

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2009 · 194 citations

Engineering, Computer Engineering, Electrical Engineering +14

Space Radiation Effects on SiC Power Device Reliability

Jean‐Marie Lauenstein, Megan C. Casey, Ray Ladbury et al. · 2021 · 96 citations

Engineering, Aerospace Engineering, Electrical Engineering +17

32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches

Kenneth P. Rodbell, David F. Heidel, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2011 · 61 citations

Engineering, Computer Engineering, Electrical Engineering +17

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

Jonathan A. Pellish, Paul W. Marshall, Kenneth P. Rodbell et al. · IEEE Transactions on Nuclear Science · 2014 · 37 citations · Full text

Engineering, Electrical Engineering, Physics +14

An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays

Melanie D. Berg, Jih-Jong Wang, Ray Ladbury et al. · IEEE Transactions on Nuclear Science · 2006 · 35 citations

Engineering, Computer Engineering, Electrical Engineering +12