Concepedia

An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays

Melanie D. Berg, Jih-Jong Wang, Ray Ladbury, Steve Buchner, Hak Kim, J.W. Howard, K.A. LaBel, Anthony M. Phan, Tim Irwin, M. Friendlich

IEEE Transactions on Nuclear Science · 2006 · 35 citations · 4 references

DOI

Concepts

Abstract

<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> In order to investigate frequency and architectural effects on Single Event Upset cross sections within RTAX-S FPGA devices, a novel approach to high speed testing is implemented. Testing was performed at variable speeds ranging from 15 MHz to 150 MHz. </para>

References

4

Comparison of error rates in combinational and sequential logic

S. Büchner, M.P. Baze, David J. Brown et al. · IEEE Transactions on Nuclear Science · 1997 · 241 citations

, , +14

Comparison of heavy ion and proton induced combinatorial and sequential logic error rates in a deep submicron process

Matthew J. Gadlage, Paul Eaton, J.M. Benedetto et al. · IEEE Transactions on Nuclear Science · 2005 · 39 citations

, , +17

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

Paul W. Marshall, Martin A. Carts, A.B. Campbell et al. · IEEE Transactions on Nuclear Science · 2004 · 36 citations

, , +14

Development of a Low-Cost and High-speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA)

James W. Howard, H. Kim, Melanie D. Berg et al. · NASA Technical Reports Server (NASA) · 2006 · 14 citations

, , +14