Jih-Jong Wang

TID and SEE Characterization of Microsemi's 4th Generation Radiation Tolerant RTG4 Flash-Based FPGA

Nadia Rezzak, Jih-Jong Wang, Durwyn Dsilva et al. · 2015 · 39 citations

Electrical Engineering, Engineering, Radiation Performance +3

An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays

Melanie D. Berg, Jih-Jong Wang, Ray Ladbury et al. · IEEE Transactions on Nuclear Science · 2006 · 35 citations

Engineering, Vlsi Design, Evolvable Hardware +19

Total Ionizing Dose Characterization of 65 nm Flash-Based FPGA

Nadia Rezzak, Jih-Jong Wang, Chang-Kai Huang et al. · 2014 · 24 citations

System On Chip, Electrical Engineering, Engineering +12

Neutron SEE Testing of the 65nm SmartFusion2 Flash-Based FPGA

Durwyn Dsilva, Jih-Jong Wang, Nadia Rezzak et al. · 2015 · 23 citations

Hardware Security, Electrical Engineering, Configuration Upset +13

SET and SEFI Characterization of the 65 nm SmartFusion2 Flash-Based FPGA under Heavy Ion Irradiation

Nadia Rezzak, Durwyn Dsilva, Jih-Jong Wang et al. · 2015 · 20 citations

Hardware Security, Electrical Engineering, Engineering +9