Ch. Walczyk

Pulse-induced low-power resistive switching in HfO2 metal-insulator-metal diodes for nonvolatile memory applications

Ch. Walczyk, Christian Wenger, Rakesh Sohal et al. · Journal of Applied Physics · 2009 · 105 citations

Semiconductors, Materials Science, Electrical Engineering +15

Hard x-ray photoelectron spectroscopy study of the electroforming in Ti/HfO2-based resistive switching structures

M. Sowińska, T. Bertaud, Damian Walczyk et al. · Applied Physics Letters · 2012 · 101 citations

Engineering, Oxidation Resistance, Electronic Modifications +16

Resistive switching characteristics of CMOS embedded HfO2-based 1T1R cells

Damian Walczyk, Ch. Walczyk, Thomas Schroeder et al. · Microelectronic Engineering · 2011 · 64 citations

Electrical Engineering, Hfo2-based 1T1r, Engineering +4

Band alignment and electron traps in Y2O3 layers on (100)Si

W. C. Wang, M. Badylevich, V. V. Afanas’ev et al. · Applied Physics Letters · 2009 · 49 citations

Blocking Insulator, Optical Materials, Engineering +16

On the role of Ti adlayers for resistive switching in HfO2-based metal-insulator-metal structures: Top versus bottom electrode integration

Ch. Walczyk, Christian Wenger, Damian Walczyk et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2011 · 43 citations

Engineering, Ti Top Adlayer, Ti Bottom Adlayer +19