Publication | Closed Access
Resistive switching characteristics of CMOS embedded HfO2-based 1T1R cells
64
Citations
16
References
2011
Year
Electrical EngineeringHfo2-based 1T1rEngineeringNanoelectronicsBias Temperature InstabilityMicroelectronicsSemiconductor Device
| Year | Citations | |
|---|---|---|
Page 1
Page 1