Concepedia

Yoshinao Miura

YM

Statistics

Publications

13

Citations

284

H-Index

11

Active since

1991

Affiliations

NEC (Japan)(Current)

Renesas Electronics (Japan)

Yoshinao Miura is an author at NEC (Japan) specializing in materials science, natural sciences, and semiconductor materials.

ORCID

Publications per year

1991–2021

13

Publications

13

Interface defects responsible for negative-bias temperature instability in plasma-nitrided SiON/Si(100) systems

Shinji Fujieda, Yoshinao Miura, Motofumi Saitoh et al. · Applied Physics Letters · 2003 · 72 citations

, , +17

Bonding configurations of nitrogen absorption peak at 960 cm−1 in silicon oxynitride films

Haruhiko Ono, Taeko Ikarashi, Yoshinao Miura et al. · Applied Physics Letters · 1999 · 51 citations

, , +11

Single-crystal Al growth on Si(111) by low-temperature molecular beam epitaxy

Yoshinao Miura, S. Fujieda, Kazuyuki Hirose · Applied Physics Letters · 1993 · 31 citations

, , +17

Reoxidation effects on the chemical bonding states of nitrogen accumulated at the oxynitride/silicon interface

Yoshinao Miura, Haruhiko Ono, K. Ando · Applied Physics Letters · 2000 · 18 citations

, , +16

Characterization of interface defects related to negative-bias temperature instability in ultrathin plasma-nitrided SiON/Si〈100〉 systems

Shinji Fujieda, Yoshinao Miura, Motofumi Saitoh et al. · Microelectronics Reliability · 2004 · 15 citations

, , +16

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