Hsiang-Jen Huang

Extreme scaling with ultra-thin Si channel MOSFETs

B. Doris, M. Ieong, T. Kanarsky et al. · 2003 · 181 citations

Engineering, Electrical Engineering, Electronic Materials +16

Study on Ge/Si ratio, silicidation, and strain relaxation of high temperature sputtered Co/Si1−xGex structures

Hsiang-Jen Huang, Kun‐Ming Chen, Chun-Yen Chang et al. · Journal of Applied Physics · 2000 · 33 citations

Engineering, Materials Engineering, Materials Science +16

Integration of high-performance, low-leakage and mixed signal features into a 100 nm CMOS technology

T. Schafbauer, J. Brighten, Yi-Cheng Chen et al. · 2003 · 22 citations

Engineering, Computer Engineering, Electrical Engineering +16

Reduction of source/drain series resistance and its impact on device performance for PMOS transistors with raised Si/sub 1-x/Ge_x source/drain

Hsiang-Jen Huang, Kun‐Ming Chen, Chun-Yen Chang et al. · IEEE Electron Device Letters · 2000 · 17 citations

Engineering, Electrical Engineering, Materials Science +15

Analysis of low-frequency noise in boron-doped polycrystalline silicon–germanium resistors

Kun‐Ming Chen, Guo‐Wei Huang, David Chiu et al. · Applied Physics Letters · 2002 · 11 citations

Engineering, Electrical Engineering, Materials Science +17