Jae‐Min Shin

Highly reliable 50nm contact cell technology for 256Mb PRAM

Sung-Tae Ahn, Y.N. Hwang, Youjian Song et al. · 2005 · 65 citations

Engineering, Electrical Engineering, Manufacturing Engineering +15

Ge₂Sb₂Te₅ Confined Structures and Integration of 64 Mb Phase-Change Random Access Memory

Fai Yeung, Su‐Jin Ahn, Young-Nam Hwang et al. · Japanese Journal of Applied Physics · 2005 · 56 citations

Engineering, Electrical Engineering, Materials Science +13

Highly Reliable Ring-Type Contact for High-Density Phase Change Memory

Changwook Jeong, Su‐Jin Ahn, Young-Nam Hwang et al. · Japanese Journal of Applied Physics · 2006 · 47 citations

Engineering, Electrical Engineering, Materials Science +14

Comparison of different methods to quantify fat classes in bakery products

Jae‐Min Shin, Young-Ok Hwang, Ock-Ju Tu et al. · Food Chemistry · 2012 · 44 citations

Agriculture, Food Science, Nutritional Sciences +9

Comparison of fat determination methods depending on fat definition in bakery products

Jae‐Min Shin, Seung-Kook Park · LWT · 2015 · 32 citations

Agriculture, Food Science, Nutritional Sciences +8