J. Holt

High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

S. O. Hruszkewycz, Marc Allain, Martin V. Holt et al. · Nature Materials · 2016 · 133 citations · Full text

Materials Science, Engineering, Microscopy +8

High Performance 45-nm SOI Technology with Enhanced Strain, Porous Low-k BEOL, and Immersion Lithography

P. Agnello, T. Ivers, C. Warm et al. · 2006 · 115 citations

Engineering, Vlsi Design, Enhanced Strain +21

Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography

S. O. Hruszkewycz, Martin V. Holt, Conal E. Murray et al. · Nano Letters · 2012 · 94 citations

Nanoscale Lattice Strain, Engineering, Microscopy +18

22nm High-performance SOI technology featuring dual-embedded stressors, Epi-Plate High-K deep-trench embedded DRAM and self-aligned Via 15LM BEOL

P. Chang, C. Ortolland, David Fried et al. · 2012 · 89 citations

High-performance Soi Technology, Engineering, Vlsi Design +16

Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography

Martin V. Holt, S. O. Hruszkewycz, Conal E. Murray et al. · Physical Review Letters · 2014 · 64 citations

Materials Science, Engineering, Physics +14