M. Schuster - Concepedia

Author

M. Schuster

Siemens (Germany)

Also Known As

M Schuster, M. SCHUSTER, M. Schuster, Manfred R. Schuster, Manfred Schuster, Schuster, M.

Publications

1.9K

Citations

H-Index

Concepts

All Affiliations

Siemens (Germany)Technical University of Munich Paul Scherrer Institute Technische Universität Dresden Schott (Germany)

About

M. Schuster is an author at Siemens (Germany) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	15	19	1.7K
2	Applied Physics	13	14	1.1K
3	Health Sciences	6	6	450
4	Natural Sciences	2	2	147
5	Medicine	1	1	26

M. Schuster

Publications

1.8K

Citations

H-Index

Page 1

	Year	Citations
Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry T. Metzger, R. Höpler, E. Born, Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties Materials ScienceDislocation DensitiesElectrical EngineeringWide-bandgap SemiconductorEngineering	1998	547
Inverse geometry for grating-based x-ray phase-contrast imaging Tilman Donath, Michael Chabior, Franz Pfeiffer, Journal of Applied Physics EngineeringMicroscopyPolycapillary OpticsInverse Interferometer GeometryX-ray Imaging	2009	175
Parallel-beam coupling into channel-cut monochromators using curved graded multilayers M. Schuster, H. Göbel Journal of Physics D Applied Physics Vertical DivergenceX-ray SpectroscopyEngineeringPhysicsMicroscopy	1995	135
Determination of the chemical composition of distorted InGaN/GaN heterostructures from x-ray diffraction data M. Schuster, P O Gervais, B. Jobst, Journal of Physics D Applied Physics Wide-bandgap SemiconductorEngineeringChemical CompositionMechanical EngineeringChemistry	1999	134
High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source Martin Engelhardt, Joachim Baumann, M. Schuster, Applied Physics Letters High ResolutionEngineeringMicroscopyGrating InterferometerX-ray Fluorescence	2007	130
Determination of the dispersive correction f'(E) to the atomic form factor from X-ray reflection F. Stanglmeier, B. Lengeler, W. Weber, Acta Crystallographica Section A Foundations of Crystallography X-ray CrystallographyX-ray SpectroscopyEngineeringChemical ShiftAbsorption Spectroscopy	1992	91
The fractional Talbot effect in differential x‐ray phase‐contrast imaging for extended and polychromatic x‐ray sources Martin Engelhardt, Christian Kottler, Oliver Bunk, Journal of Microscopy	2008	83
Growth of high quality InGaAsN heterostructures and their laser application A. Yu. Egorov, D. Bernklau, B. Borchert, Journal of Crystal Growth Materials ScienceOptical MaterialsEngineeringOptical PropertiesApplied Physics	2001	78
Beam hardening effects in grating‐based x‐ray phase‐contrast imaging Michael Chabior, Tilman Donath, Christian Dávid, Medical Physics	2011	64
Surface analysis by spectroscopy of Auger electrons induced by surface channeled ions M. Schuster, C. Varelas Surface Science Surface CharacterizationEngineeringPhysicsSurface ChemistryNatural Sciences	1983	56

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