M. Schuster

Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

T. Metzger, R. Höpler, E. Born et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1998 · 547 citations

Materials Science, Dislocation Densities, Electrical Engineering +14

Inverse geometry for grating-based x-ray phase-contrast imaging

Tilman Donath, Michael Chabior, Franz Pfeiffer et al. · Journal of Applied Physics · 2009 · 175 citations · Full text

Engineering, Microscopy, Polycapillary Optics +18

Parallel-beam coupling into channel-cut monochromators using curved graded multilayers

M. Schuster, H. Göbel · Journal of Physics D Applied Physics · 1995 · 135 citations

Vertical Divergence, X-ray Spectroscopy, Engineering +15

Determination of the chemical composition of distorted InGaN/GaN heterostructures from x-ray diffraction data

M. Schuster, P O Gervais, B. Jobst et al. · Journal of Physics D Applied Physics · 1999 · 134 citations

Wide-bandgap Semiconductor, Engineering, Chemical Composition +17

High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source

Martin Engelhardt, Joachim Baumann, M. Schuster et al. · Applied Physics Letters · 2007 · 130 citations · Full text

High Resolution, Engineering, Microscopy +17