M. Schuster

Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

T. Metzger, R. Höpler, E. Born et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1998 · 553 citations

Natural Sciences, Materials Engineering, Materials Science +17

Inverse geometry for grating-based x-ray phase-contrast imaging

Tilman Donath, Michael Chabior, Franz Pfeiffer et al. · Journal of Applied Physics · 2009 · 177 citations · Full text

Veterinary Medicine, Biomedical Engineering, Radiology +17

Parallel-beam coupling into channel-cut monochromators using curved graded multilayers

M. Schuster, H. Göbel · Journal of Physics D Applied Physics · 1995 · 136 citations

Natural Sciences, Radiology, Optics +13

Determination of the chemical composition of distorted InGaN/GaN heterostructures from x-ray diffraction data

M. Schuster, P O Gervais, B. Jobst et al. · Journal of Physics D Applied Physics · 1999 · 135 citations

Engineering, Materials Engineering, Materials Science +17

High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source

Martin Engelhardt, Joachim Baumann, M. Schuster et al. · Applied Physics Letters · 2007 · 130 citations · Full text

Natural Sciences, Biomedical Engineering, Entomology +14