H. Göbel

Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

T. Metzger, R. Höpler, E. Born et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1998 · 547 citations

Materials Science, Dislocation Densities, Electrical Engineering +14

Existence range, structural and dielectric properties of ZrxTiySnzO4 ceramics (x+y+z=2)

G. Wolfram, H. Göbel · Materials Research Bulletin · 1981 · 286 citations

Materials Science, Engineering, Existence Range +6

JCPDS—International Centre for Diffraction Data round robin study of silver behenate. A possible low-angle X-ray diffraction calibration standard

Thomas N. Blanton, T. C. Huang, H. Toraya et al. · Powder Diffraction · 1995 · 206 citations

Materials Science, X-ray Crystallography, Materials Engineering +15

Parallel-beam coupling into channel-cut monochromators using curved graded multilayers

M. Schuster, H. Göbel · Journal of Physics D Applied Physics · 1995 · 135 citations

Vertical Divergence, X-ray Spectroscopy, Engineering +15

Measurement of the Abundance of Radioactive¹⁰Be and Other Light Isotopes in Cosmic Radiation up to 2 GeV Nucleon⁻¹with the Balloon‐borne Instrument ISOMAX

T. Hams, L. Barbier, M. Bremerich et al. · The Astrophysical Journal · 2004 · 117 citations · Full text