S. C. Song

A Novel Electrode-Induced Strain Engineering for High Performance SOI FinFET utilizing Si (1hannel for Both N and PMOSFETs

Chang Yong Kang, Rino Choi, S. C. Song et al. · 2006 · 33 citations

Engineering, Electrical Engineering, Materials Science +17

Charge trapping and detrapping characteristics in hafnium silicate gate dielectric using an inversion pulse measurement technique

Rino Choi, S. C. Song, Chadwin D. Young et al. · Applied Physics Letters · 2005 · 27 citations

Engineering, Electrical Engineering, Materials Science +17

Comparison of Plasma-Induced Damage in SIO2/TIN and HFO2/TIN Gate Stacks

Chadwin D. Young, G. Bersuker, Feng Zhu et al. · 2007 · 23 citations

Natural Sciences, Electrical Engineering, Materials Science +17

A versatile 0.13 μm CMOS platform technology supporting high performance and low power applications

A.H. Perera, B. Smith, N. Cave et al. · 2002 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of plasma induced damage on PMOSFETs Tin/HF silicate stack

S. C. Song, S.H. Bae, Z. Zhang et al. · 2005 · 12 citations

Engineering, Electrical Engineering, Physics +17