F. Martín

HfO 2 / SiO 2 interface chemistry studied by synchrotron radiation x-ray photoelectron spectroscopy

O. Renault, D. Samour, J.-F. Damlencourt et al. · Applied Physics Letters · 2002 · 200 citations

Materials Science, Ii-vi Semiconductor, Sio2 Contributions +14

Carrier transport in HfO/sub 2//metal gate MOSFETs: physical insight into critical parameters

M. Cassé, L. Thévenod, B. Guillaumot et al. · IEEE Transactions on Electron Devices · 2006 · 131 citations

Device Modeling, Electrical Engineering, Physical Insight +14

Triggering and guiding high-voltage large-scale leader discharges with sub-joule ultrashort laser pulses

H. Pépin, D. Comtois, François Vidal et al. · Physics of Plasmas · 2001 · 128 citations

Electrical Engineering, Leader Discharges, Engineering +14

Interface and material characterization of thin Al2O3 layers deposited by ALD using TMA/H2O

L.G. Gosset, J.-F. Damlencourt, O. Renault et al. · Journal of Non-Crystalline Solids · 2002 · 125 citations

Materials Science, Aluminium Nitride, Material Analysis +7

Single shot phase contrast imaging using laser-produced Betatron x-ray beams

S. Fourmaux, S. Corde, K. Ta Phuoc et al. · Optics Letters · 2011 · 121 citations · Full text