F. Martín

HfO 2 / SiO 2 interface chemistry studied by synchrotron radiation x-ray photoelectron spectroscopy

O. Renault, D. Samour, J.-F. Damlencourt et al. · Applied Physics Letters · 2002 · 202 citations

Natural Sciences, Chemistry, Materials Science +17

Carrier transport in HfO/sub 2//metal gate MOSFETs: physical insight into critical parameters

M. Cassé, L. Thévenod, B. Guillaumot et al. · IEEE Transactions on Electron Devices · 2006 · 131 citations

Engineering, Electrical Engineering, Physics +17

Triggering and guiding high-voltage large-scale leader discharges with sub-joule ultrashort laser pulses

H. Pépin, D. Comtois, François Vidal et al. · Physics of Plasmas · 2001 · 129 citations

Natural Sciences, Physics, Atmospheric Electricity +13

Interface and material characterization of thin Al2O3 layers deposited by ALD using TMA/H2O

L.G. Gosset, J.-F. Damlencourt, O. Renault et al. · Journal of Non-Crystalline Solids · 2002 · 128 citations

Natural Sciences, Materials Engineering, Materials Science +11

Single shot phase contrast imaging using laser-produced Betatron x-ray beams

S. Fourmaux, S. Corde, K. Ta Phuoc et al. · Optics Letters · 2011 · 127 citations · Full text

Natural Sciences, Physics, Radiology +13