Sofie Beyne

Interconnect metals beyond copper: reliability challenges and opportunities

Kristof Croes, Christoph Adelmann, Christopher Wilson et al. · 2018 · 83 citations

Materials Science, Materials Engineering, Electrical Engineering +15

Sub-100 nm² Cobalt Interconnects

Shibesh Dutta, Sofie Beyne, Anshul Gupta et al. · IEEE Electron Device Letters · 2018 · 82 citations

Electrical Engineering, High-tc Superconductivity, Engineering +14

Electromigration Activation Energies in Alternative Metal Interconnects

Sofie Beyne, Olalla Varela Pedreira, Herman Oprins et al. · IEEE Transactions on Electron Devices · 2019 · 40 citations · Full text

Materials Science, Materials Engineering, Electrical Engineering +14

1/f noise measurements for faster evaluation of electromigration in advanced microelectronics interconnections

Sofie Beyne, Kristof Croes, Ingrid De Wolf et al. · Journal of Applied Physics · 2016 · 31 citations · Full text

Engineering, Vlsi Design, Advanced Microelectronics Interconnections +21

Low-frequency noise and defects in copper and ruthenium resistors

Daniel M. Fleetwood, Sofie Beyne, Rong Jiang et al. · Applied Physics Letters · 2019 · 14 citations · Full text

Engineering, Ru Resistors, Low-frequency Noise +17