Roger Dufresne

Voltage-dependent voltage-acceleration of oxide breakdown for ultra-thin oxides

Ernest Y. Wu, J. Aitken, E. Nowak et al. · 2002 · 82 citations

Engineering, Electrical Engineering, Materials Science +17

Abrupt current increase due to space-charge-limited conduction in thin nitride–oxide stacked dielectric system

Chen Fen, Baozhen Li, Roger Dufresne et al. · Journal of Applied Physics · 2001 · 36 citations

Engineering, Electrical Engineering, Materials Science +17

New breakdown data generation and analytics methodology to address BEOL and mol dielectric TDDB process development and technology qualification challenges

Fen Chen, Carole Graas, M. Shinosky et al. · 2014 · 35 citations

Engineering, Electrical Engineering, Materials Engineering +17

Determination of ultra-thin oxide voltages and thickness and the impact on reliability projection

Ernest Y. Wu, S.-H. Lo, W.W. Abadeer et al. · 2002 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

New electrical testing structures and analysis method for MOL and BEOL process diagnostics and TDDB reliability assessment

Fen Chen, S. Mittl, M. Shinosky et al. · 2013 · 16 citations

Engineering, Electrical Engineering, Materials Engineering +16