Y.-L. Li

Internal photoemission of electrons at interfaces of metals with low-κ insulators

S. Shamuilia, V. V. Afanas’ev, P. Somers et al. · Applied Physics Letters · 2006 · 48 citations

Engineering, Charge Transport, Semiconductors +20

Reliability challenges for copper low-k dielectrics and copper diffusion barriers

Zs. Tôkei, Y.-L. Li, Gerald Beyer · Microelectronics Reliability · 2005 · 37 citations

Materials Science, Electrical Engineering, Electromigration Technique +11

Electrical characterization method to study barrier integrity in 3D through-silicon vias

Y.-L. Li, Dimitrios Velenis, T. Kauerauf et al. · 2012 · 27 citations

Engineering, Electrical Characterization Method, Interconnect (Integrated Circuits) +17