T.L. Meisenheimer

Effects of oxide traps, interface traps, and ‘‘border traps’’ on metal-oxide-semiconductor devices

Daniel M. Fleetwood, P.S. Winokur, R.A. Reber et al. · Journal of Applied Physics · 1993 · 494 citations

Engineering, Integrated Circuits, Defect Tolerance +18

1/f noise and radiation effects in MOS devices

Daniel M. Fleetwood, T.L. Meisenheimer, John H. Scofield · IEEE Transactions on Electron Devices · 1994 · 197 citations

Trap Energy, Electrical Engineering, Engineering +11

Border traps: Issues for MOS radiation response and long-term reliability

Daniel M. Fleetwood, M.R. Shaneyfelt, W. L. Warren et al. · Microelectronics Reliability · 1995 · 178 citations

Radiation Detection, Health Sciences, Bias Temperature Instability +6

Cyanide-induced neurotoxicity: Role of neuronal calcium

Jerry D. Johnson, T.L. Meisenheimer, Gary E. Isom · Toxicology and Applied Pharmacology · 1986 · 129 citations

Neurophysiology, Cyanide-induced Neurotoxicity, Medicine +7

1/f noise, hydrogen transport, and latent interface-trap buildup in irradiated MOS devices

Daniel M. Fleetwood, M.J. Johnson, T.L. Meisenheimer et al. · IEEE Transactions on Nuclear Science · 1997 · 100 citations

Electrical Engineering, Oki Pmos Transistors, Engineering +12