Concepedia

Publication | Closed Access

Border traps: Issues for MOS radiation response and long-term reliability

DOI

178

Citations

73

References

1995

Year

Daniel M. Fleetwood, M.R. Shaneyfelt, W. L. Warren, J.R. Schwank, T.L. Meisenheimer, P.S. Winokur
Microelectronics Reliability

References

YearCitations

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