E. Luckowski

Electrical characteristics of schottky barriers on 4H-SiC: The effects of barrier height nonuniformity

B. J. Skromme, E. Luckowski, Karen Moore et al. · Journal of Electronic Materials · 2000 · 98 citations

Electrical Characteristics, Electrical Engineering, Barrier Height Nonuniformity +6

Titanium and aluminum-titanium ohmic contacts to p-type SiC

J. Crofton, L.M. Beyer, John R. Williams et al. · Solid-State Electronics · 1997 · 87 citations

Materials Engineering, Materials Science, Engineering +4

Challenges for the integration of metal gate electrodes

J. Schaeffer, C. Capasso, L. R. C. Fonseca et al. · 2005 · 71 citations

Materials Science, Electrical Engineering, Metal Gate Electrodes +14

Etching of 6H‐SiC and 4H‐SiC using  NF 3 in a Reactive Ion Etching System

Jeff B. Casady, E. Luckowski, Michael J. Bozack et al. · Journal of The Electrochemical Society · 1996 · 46 citations

Materials Engineering, Materials Science, Electrical Engineering +12

Dual-metal gate CMOS with HfO/sub 2/ gate dielectric

S. Samavedam, L.B. La, James A. Smith et al. · 2003 · 37 citations

Dual-metal Integration, Electrical Engineering, Engineering +9