Statistics
Publications
18
Citations
421
H-Index
13
Active since
2002
V. Bader is an author at Fraunhofer Institute for Reliability and Microintegration specializing in engineering, packaging engineering, and chip packaging.
Publications per year
2002–2016
18
18
Large area compression molding for Fan-out Panel Level Packing
Tanja Braun, S. Raatz, S. Voges et al. · 2015 · 77 citations
Engineering, Manufacturing Engineering, Manufacturing Processes +11
High-temperature reliability of Flip Chip assemblies
T. Braun, Karl‐Friedrich Becker, Matthias Koch et al. · Microelectronics Reliability · 2005 · 53 citations
Through mold vias for stacking of mold embedded packages
Tanja Braun, K.-F. Becker, S. Voges et al. · 2011 · 40 citations
Engineering, Manufacturing Engineering, Materials Engineering +16
24"×18" Fan-out panel level packing
Tanja Braun, K.-F. Becker, S. Voges et al. · 2014 · 24 citations
1–5 of 18