Statistics
Publications
6
Citations
210
H-Index
6
Active since
2003
Affiliations
James N. Pan is an author at Advanced Micro Devices (United States) specializing in microelectronics, semiconductor devices, and engineering.
Publications per year
2003–2006
6
6
Scalability of strained-Si nMOSFETs down to 25 nm gate length
Jung-Suk Goo, Qian Xiang, Yuzuru Takamura et al. · IEEE Electron Device Letters · 2003 · 57 citations
Strained silicon NMOS with nickel-silicide metal gate
Qian Xiang, Jung-Suk Goo, James N. Pan et al. · 2004 · 50 citations
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