Jung-Suk Goo

A noise optimization technique for integrated low-noise amplifiers

Jung-Suk Goo, Hee-Tae Ahn, D. Ladwig et al. · IEEE Journal of Solid-State Circuits · 2002 · 141 citations

Electrical Engineering, Source Degeneration Inductance, Engineering +10

An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs

R.W. Dutton, T.H. Lee, H. Iwai et al. · IEEE Transactions on Electron Devices · 2000 · 72 citations

Device Modeling, Electrical Engineering, Engineering +10

Transistors with dual work function metal gates by single full silicidation (FUSI) of polysilicon gates

W. Maszara, Zoran Krivokapić, P King et al. · 2003 · 72 citations

Materials Science, Nmos Dielectric, Electrical Engineering +12

MOS C-V characterization of ultrathin gate oxide thickness (1.3-1.8 nm)

Changhoon Choi, Jung-Suk Goo, Tae-Young Oh et al. · IEEE Electron Device Letters · 1999 · 70 citations

Materials Science, Device Modeling, Electrical Engineering +14

Scalability of strained-Si nMOSFETs down to 25 nm gate length

Jung-Suk Goo, Qian Xiang, Yuzuru Takamura et al. · IEEE Electron Device Letters · 2003 · 57 citations

Electrical Engineering, Engineering, Strained-si Nmosfets +9