Concepedia

C. Woo

CW

Statistics

Publications

3

Citations

69

H-Index

3

Active since

2003

Affiliations

Advanced Micro Devices (United States)(Current)

C. Woo is an author at Advanced Micro Devices (United States) specializing in materials science, metal gate electrodes, and metal gates.

Publications per year

2003–2004

3

Publications

3

Barrier layer, geometry and alloying effects on the microstructure and texture of electroplated copper thin films and damascene lines

T. Muppidi, David P. Field, J. E. Sanchez et al. · Thin Solid Films · 2004 · 32 citations

, , +16

Replacement metal-gate NMOSFETs with ALD TaN/EP-Cu, PVD Ta, and PVD TaN electrode

James N. Pan, C. Woo, Chih-Yuh Yang et al. · IEEE Electron Device Letters · 2003 · 26 citations

, , +17

The Effect of Annealing Temperatures on Self-Aligned Replacement (Damascene) TaCN–TaN-Stacked Gate pMOSFETs

James N. Pan, C. Woo, Madison Ngo et al. · IEEE Transactions on Electron Devices · 2004 · 11 citations

, , +17

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