N. Moumen

Interfacial Layer-Induced Mobility Degradation in High-<i>k</i>Transistors

G. Bersuker, Joel Barnett, N. Moumen et al. · Japanese Journal of Applied Physics · 2004 · 74 citations

Materials Science, Semiconductor Technology, Electrical Engineering +13

Giant Piezoresistive On/Off Ratios in Rare-Earth Chalcogenide Thin Films Enabling Nanomechanical Switching

M. Copel, Marcelo A. Kuroda, Michael S. Gordon et al. · Nano Letters · 2013 · 39 citations

Integration of dual metal gate CMOS with TaSiN (NMOS) and Ru (PMOS) gate electrodes on HfO/sub 2/ gate dielectric

Z.B. Zhang, Sook‐Keun Song, C. Huffman et al. · 2005 · 25 citations

Electrical Engineering, Gate Electrodes, Engineering +14

Experimental Study of Etched Back Thermal Oxide for Optimization of the Si/High-k Interface

Joel Barnett, N. Moumen, J. Gutt et al. · MRS Proceedings · 2004 · 24 citations

Materials Engineering, Materials Science, Engineering +11

Localized transient charging and it's implication on the hot carrier reliability of HfSiON MOSFETs

Byoung Hun Lee, J.H. Sim, Rino Choi et al. · 2004 · 15 citations

Electrical Engineering, Semiconductor Device, Engineering +14