Trey Reece

Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

T. D. Loveless, S. Jagannathan, Trey Reece et al. · IEEE Transactions on Nuclear Science · 2011 · 123 citations

Engineering, Dice Designs, Neutron Scattering +16

Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections

N. J. Gaspard, S. Jagannathan, Z. J. Diggins et al. · IEEE Transactions on Nuclear Science · 2013 · 52 citations

Engineering, Vlsi Design, Nuclear Physics +17

On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

T. D. Loveless, J. S. Kauppila, S. Jagannathan et al. · IEEE Transactions on Nuclear Science · 2012 · 50 citations

Engineering, Vlsi Design, Measurement +18

Nanoscale domain patterns in ultrathin polymer ferroelectric films

Pankaj Sharma, Trey Reece, Depei Wu et al. · Journal of Physics Condensed Matter · 2009 · 46 citations

Materials Science, Polarization Reversal, Multiferroics +15

Analysis of data-leak hardware Trojans in AES cryptographic circuits

Trey Reece, William H. Robinson · 2013 · 27 citations

Hardware Trojan, Engineering, Information Security +16