Z. J. Diggins

Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections

N. J. Gaspard, S. Jagannathan, Z. J. Diggins et al. · IEEE Transactions on Nuclear Science · 2013 · 52 citations

Engineering, Vlsi Design, Nuclear Physics +17

Temperature dependence of soft error rate in flip-flop designs

S. Jagannathan, Z. J. Diggins, N. N. Mahatme et al. · 2012 · 24 citations

Engineering, Vlsi Design, Temperature Dependence +18

Estimation of hardened flip-flop neutron soft error rates using SRAM multiple-cell upset data in bulk CMOS

N. J. Gaspard, S. Jagannathan, Z. J. Diggins et al. · 2013 · 21 citations

Hardware Security, Electrical Engineering, Engineering +14

Range-Finding Sensor Degradation in Gamma Radiation Environments

Z. J. Diggins, Nagabhushan Mahadevan, Dan Herbison et al. · IEEE Sensors Journal · 2014 · 21 citations

Effects of Total-Ionizing-Dose Irradiation on SEU- and SET-Induced Soft Errors in Bulk 40-nm Sequential Circuits

Rongmei Chen, Z. J. Diggins, N. N. Mahatme et al. · IEEE Transactions on Nuclear Science · 2016 · 21 citations

Single Event Upset, Engineering, Nuclear Physics +21