Statistics
Publications
3
Citations
56
H-Index
3
Active since
2006
Charlotte Beylier is an author at STMicroelectronics (France) specializing in engineering, manufacturing engineering, and image processing.
Publications per year
2006–2021
3
3
Contour based metrology: getting more from a SEM image
Bertrand Le-Gratiet, R. Bouyssou, J. Ducoté et al. · 2019 · 17 citations
Engineering, Manufacturing Engineering, Image Interpretation +16
Pierre Chevalier, Patrick Quéméré, Sébastien Bérard-Bergery et al. · Journal of Microelectromechanical Systems · 2021 · 14 citations · Full text
Engineering, Manufacturing Engineering, Materials Engineering +10
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