N. Stavitski

Systematic TLM Measurements of NiSi and PtSi Specific Contact Resistance to n- and p-Type Si in a Broad Doping Range

N. Stavitski, M.J.H. van Dal, A. Lauwers et al. · IEEE Electron Device Letters · 2008 · 97 citations

Engineering, Integrated Circuits, Silicon On Insulator +17

Cross-Bridge Kelvin Resistor Structures for Reliable Measurement of Low Contact Resistances and Contact Interface Characterization

N. Stavitski, J.H. Klootwijk, H.W. van Zeijl et al. · IEEE Transactions on Semiconductor Manufacturing · 2009 · 50 citations · Full text

Materials Science, Contact Interface Characterization, Electrical Engineering +15

Evaluation of Transmission Line Model Structures for Silicide-to-Silicon Specific Contact Resistance Extraction

N. Stavitski, M.J.H. van Dal, A. Lauwers et al. · IEEE Transactions on Electron Devices · 2008 · 25 citations

Electrical Engineering, Engineering, Tlm Structures +10

Specific contact resistance measurements of metal-semiconductor junctions

N. Stavitski, M.J.H. van Dal, R.A.M. Wolters et al. · 2006 · 20 citations

Electrical Engineering, Engineering, Specific Resistance +13

Substrate-free crystallization of distorted hexagonal barium titanate thin films

N. Stavitski, V. Lyahovitskaya, J.P. Nair et al. · Applied Physics Letters · 2002 · 12 citations

Materials Science, Multiferroics, Substrate-free Crystallized Batio3 +14