L. Deferm

Analysis of the enhanced hot-electron injection in split-gate transistors useful for EEPROM applications

Jan Van Houdt, Paul Heremans, L. Deferm et al. · IEEE Transactions on Electron Devices · 1992 · 75 citations

Device Modeling, Electrical Engineering, Engineering +13

HIM0S-a high efficiency flash E/sup 2/PROM cell for embedded memory applications

Jan Van Houdt, L. Haspeslagh, D. Wellekens et al. · IEEE Transactions on Electron Devices · 1993 · 61 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +18

The behavior of silicon <i>p</i>-<i>n</i> junction-based devices at liquid helium temperatures

Eddy Simoen, B. Dierickx, L. Deferm et al. · Journal of Applied Physics · 1991 · 50 citations

Engineering, Semiconductor Physics, Silicon On Insulator +18

Modeling the subthreshold swing in MOSFET's

E.P. Vandamme, P. Jansen, L. Deferm · IEEE Electron Device Letters · 1997 · 43 citations

Device Modeling, Electrical Engineering, Semiconductor Device +12

Impact of polysilicon emitter interfacial layer engineering on the 1/f noise of bipolar transistors

Eddy Simoen, Stefaan Decoutere, Alan Cuthbertson et al. · IEEE Transactions on Electron Devices · 1996 · 42 citations

Electrical Engineering, Engineering, Electronic Engineering +10